Email:xu@hlkncse.com
Tel:13358064333
Fluid Control Division​
Wet Electroplating Equipment

In advanced semiconductor manufacturing and packaging, electroplating is a cornerstone process for key steps such as metal interconnects, TSVs (Through-Silicon Vias), and RDLs (Redistribution Layers). Wet electroplating equipment, with its fully automated process chain, high-precision parameter control, and intelligent fault diagnosis system, provides reliable metallization solutions for 5G chips, AI processors, and 3D packaging. The following sections offer a comprehensive analysis of its technical advantages, covering process flow, chemical management, parameter optimization, and problem resolution.


I. Core Equipment Process Flow
A three-step closed-loop process achieves nanoscale coating uniformity.

  • Pre-treatment

    • Descaling Cleaning: Acidic solution (H₂SO₄/H₂O₂) removes oxides and organic residues from the wafer surface.

    • Micro-etching Activation: Dilute hydrochloric acid (HCl) etches the surface to enhance coating adhesion.

  • Electroplating

    • Pulse Plating Technology: Periodic Reverse Current (PRC) fills high-aspect-ratio vias, preventing void defects.

    • Dynamic Flow Control: Multi-zone spray design ensures uniform chemical distribution, with edge-to-center thickness variation <3%.

  • Post-treatment

    • Deionized Water (DIW) Rinse: Multi-stage counter-current cleaning reduces chemical cross-contamination.

    • Drying: Nitrogen blow-off + infrared drying eliminates water stain residue.


II. Key Chemicals and Environmental Solutions


Process StageChemicalConcentration RangeFunction
Pre-treatmentSulfuric Acid (H₂SO₄)10-15% volOxide layer stripping

Hydrogen Peroxide (H₂O₂)5-8% volOrganic contaminant decomposition
ElectroplatingCopper Sulfate (CuSO₄)40-60 g/LMetal ion source

Brightener (PEG/Cl⁻)50-200 ppmCoating grain refinement and leveling
Post-treatmentCitric Acid (C₆H₈O₇)2-5% wtNeutralizes residual acid, prevents oxidation

III. Core Process Parameters and Stability Control

ParameterSetting RangePrecision ControlImpact Indicator
Plating Temperature22±0.5℃PID Constant Temperature SystemCoating crystallization speed & density
Current Density3-8 ASDMulti-zone Independent AdjustmentVia filling capability
Fluid Velocity1.5-3.0 m/sClosed-loop Flow SensorsBoundary layer thickness, suppresses concentration polarization
pH Value1.2-1.5 (CuSO₄ system)Online pH Meter + Auto DosingBath stability & deposition rate


IV. Typical Process Issues & Solutions

  • Issue: Coating Thickness Non-uniformity (Edge-Edge Variation)

    • Cause: Excessive edge current density or uneven fluid distribution.

    • Solution: Activate "edge shield ring" design coupled with a multi-zone adaptive flow control algorithm.

  • Issue: Voids inside TSVs (Void Formation)

    • Cause: Abnormal additive consumption or mismatched pulse current parameters.

    • Solution: Integrate online CVS (Cyclic Voltammetric Stripping) to monitor additive concentration and dynamically adjust duty cycle.

  • Issue: Particle Contamination

    • Cause: Insufficient fluid filtration efficiency or wafer holder wear.

    • Solution: Employ a 0.1μm dual-stage filtration system equipped with a particle counter linked to an alarm.


V. Core Equipment Value

  • High Efficiency & Stability: UPH (Units Per Hour) reaches 300 wafers (300mm), yield >99.5%.

  • High Precision & Compatibility: Supports sub-10nm processes and 2.5D/3D packaging structures.

  • Intelligent Operation: AI-based process parameter self-learning system reduces failure rate by 40%.


Conclusion
Wet electroplating equipment, with its core competencies of process traceability, zero chemical waste, and real-time defect interception, empowers customers to push the boundaries of Moore's Law.